yieldHUB is a yield management platform for semiconductor test data, founded in 2005 in Ireland. It centralizes data from fab, wafer probe and final test, and analyzes it for yield, outliers and part average testing. TofuPilot is a test platform for electronics, assemblies and systems: it runs the tests on the station with the open-source TofuPilot Framework and analyzes the results in its dashboard. The two overlap on analytics but start from different places. This guide shows where each fits.
Facts about yieldHUB come from its public website in November 2026. Its pricing is not public.
Scope
| yieldHUB | TofuPilot | |
|---|---|---|
| Industry focus | Semiconductor: fabless, IDM, OSAT, foundry, advanced packaging | Electronics, PCBA, batteries, robotics, aerospace, data center hardware |
| Test stages | Fab, WAT/PCM, wafer sort, final test, reliability | Board, module, assembly and system test, end of line, burn-in |
| Runs the test | No, analyzes data from ATE test programs | Yes, executes procedures on the station, or ingests results |
| Data in | STDF and raw tester logs | Framework runs, pytest, OpenHTF, Robot Framework, SDKs, and imports (STDF, ATDF, ATML, TestStand, WATS, CSV, Excel) |
| Deployment | Cloud or on-premises | Hosted or self-hosted |
| Pricing | On quote | Public plans (Lab, Pro), Enterprise on quote |
Analytics Compared
| Capability | yieldHUB | TofuPilot |
|---|---|---|
| Yield and first pass yield | Yes | Yes |
| Bin analysis and Pareto | Yes | Failure Pareto by phase and measurement |
| Cp and Cpk | Yes | Yes |
| Control charts | Statistical tools for automotive and aerospace | Yes |
| Wafer maps | Yes | No |
| Part average testing (DPAT, SPAT) | Yes, AEC-Q001 | No |
| Die-level traceability | Yes | Unit, sub-unit and serial number traceability |
| Real-time action on the tester | yieldHUB Live, device by device | Live run streaming, alerts on measurements |
| Test execution and operator UI | No | Yes |
| Deploying test versions to stations | No | Git push, instant rollback |
When yieldHUB Fits
- The product is a die or a packaged IC tested on ATE.
- Analysis is organized by lot, wafer and die, with wafer maps and bin limits.
- Automotive customers require part average testing per AEC-Q001.
When TofuPilot Fits
- The product is a board, module or system, tested on stations you build.
- The team writes and maintains the test procedures, and needs them versioned and deployed to every station.
- Each unit has a serial number and sub-units whose history must be kept.
- Operators interact with the test: scanning, prompts, visual checks.
Using Both
A hardware company often has both stages: ICs qualified by a supplier on ATE, then boards and systems tested in-house. yieldHUB covers the semiconductor stage. TofuPilot covers board and system test, and can import STDF datalogs when component-level results must sit next to the assembly results in one unit history. See STDF import.
For other test data platforms, see WATS Alternatives for Test Data Management.
