INDUSTRIES / SEMICONDUCTORS

Follow the device behind the datalog.

Bring semiconductor test results into a record your engineers can explore. Import supported ATE datalogs, preserve measured values and limits, and keep device identity and lot context with each run.

Explore the workflow Talk about your test

Silicon wafer beside packaged and exposed semiconductor chips

Open the device result.

Import STDF measurements and limits while keeping your existing tester.

Preserve the lot context.

Compare equivalent devices by lot, wafer and test-program version.

Keep every attempt.

Use consistent device identifiers to connect the original test and retest.

WORKFLOW EXAMPLE

Move from an STDF file to a device-level review.

An illustrative workflow for existing semiconductor test data. The ATE performs the measurements; the review starts from its imported results.

WORKFLOW EXAMPLEDIE-W03-X18-Y09

Device → datalog → run

Wafer / dieW03 · X18 · Y09

ATE datalogSTDF import

Device resultLeakage · limits

Keep the die coordinates and lot with the measurements imported from the tester.

Import the datalog
Attach an STDF file to the procedure and import its device results, numeric measurements, and limits.
Compare the measurements
Review the failed test and its distribution, using recorded lot and test-program context to select comparable runs.
Keep the follow-up result
Import a repeat test with the same device identifier and compare it with the original attempt.

ALERT & NEXT STEP · EXAMPLE

A device fails its leakage-current measurement.

Notify the responsible engineer with the device and run link. Check the test conditions and related lot results before scheduling a targeted repeat on the tester.

Connect the next step

RESOURCES