Guides

Learn how to version control hardware test scripts with Git and link test results to code versions in TofuPilot.

Actionable strategies to improve first pass yield (FPY) in electronics manufacturing, with root cause analysis, Pareto charts, limit refinement, and TofuPilot.

A structured comparison of OpenHTF and pytest for manufacturing test automation, with code examples, tradeoffs, and guidance on when to use each framework.

Learn how to use control charts to monitor test process stability, distinguish control limits from spec limits, and detect out-of-control conditions with.

Learn how to structure, store, and query electronics test data with TofuPilot for automatic traceability, yield tracking, and process control.

Automated test equipment (ATE) runs production tests without manual intervention. Learn what ATE involves, how to build Python-based systems, and track results.

Learn how to capture, store, and analyze time-series measurement data from hardware tests using TofuPilot's multi-dimensional arrays.

Learn how the 80/20 Pareto principle applies to test failures, how to write tests that produce actionable failure data, and how to use TofuPilot's Pareto chart.

Learn how to build a tkinter-based test panel GUI that controls instruments and runs OpenHTF tests with TofuPilot logging.

Compare in-circuit test (ICT), functional test (FCT), and flying probe for PCBA manufacturing, with cost analysis, coverage tradeoffs, and decision criteria.

Learn why retesting wastes 10-30% of test capacity, how to fix root causes with better OpenHTF patterns, and how TofuPilot tracks retest rates.

Understand Cp and Cpk formulas, what different Cpk values mean for your process, and how TofuPilot calculates them from your test data.