Guides

Record parent/child serial number relationships in your test data to trace sub-assemblies across boards, modules, and final products.

Learn how to track operator training, certification status, and test authorization using TofuPilot properties and station access controls.

Learn how to measure Rolled Throughput Yield (RTY) across multi-step manufacturing processes and track it in TofuPilot's dashboard.

Learn what test data management is, why spreadsheets fail at scale, and how TofuPilot structures your electronics test data automatically.

Learn how retesting inflates costs in manufacturing, identify root causes, and use TofuPilot's unit history to track and reduce retest rates.

Learn how to structure your OpenHTF tests so TofuPilot automatically generates manufacturing KPI dashboards with FPY, throughput, Cpk, and failure analysis.

Learn how to build scalable hardware test infrastructure using TofuPilot as the data backbone for test stations, instruments, and automation.

A practical guide to replacing NI TestStand with Python and OpenHTF for manufacturing test, with step-by-step migration patterns and TofuPilot integration.

Zero-defect manufacturing aims to prevent defects rather than detect them. Learn what it means in practice, what it requires, and how test data supports it.

Learn how to accelerate hardware test cadence using TofuPilot to identify bottlenecks, reduce debug time, and optimize test coverage.

Link every test result to a specific serial number and track each unit's complete test history through its production lifecycle.

Learn how to track wafer-level and final test data for semiconductors using TofuPilot for CP/FT yield analysis and bin mapping.