Guides

Learn how to capture, store, and analyze time-series measurement data from hardware tests using TofuPilot's multi-dimensional arrays.

Learn how the 80/20 Pareto principle applies to test failures, how to write tests that produce actionable failure data, and how to use TofuPilot's Pareto chart.

Learn why retesting wastes 10-30% of test capacity, how to fix root causes with better OpenHTF patterns, and how TofuPilot tracks retest rates.

Understand Cp and Cpk formulas, what different Cpk values mean for your process, and how TofuPilot calculates them from your test data.

Learn how to measure Rolled Throughput Yield (RTY) across multi-step manufacturing processes and track it in TofuPilot's dashboard.

Learn what test data management is, why spreadsheets fail at scale, and how TofuPilot structures your electronics test data automatically.

Learn how retesting inflates costs in manufacturing, identify root causes, and use TofuPilot's unit history to track and reduce retest rates.

Learn how to structure your OpenHTF tests so TofuPilot automatically generates manufacturing KPI dashboards with FPY, throughput, Cpk, and failure analysis.

Learn how to derive statistically sound measurement limits from production data using the 3-sigma method, detect distribution anomalies, and configure.

Learn the FPY formula, how it differs from rework yield and rolled throughput yield, and how TofuPilot tracks it automatically.

Learn how to compare hardware test runs side by side in TofuPilot to diagnose failures and track measurement changes across units.

Gage R&R and MSA quantify measurement system variation. Learn how to assess your test equipment and track measurement reliability with TofuPilot.