Guides

Learn how to calculate first pass yield (FPY), why it matters for manufacturing test, and how to track it automatically with TofuPilot.

Test observability gives full visibility into what your test systems are doing, why they fail, and how they perform. Learn how it applies to manufacturing test.

Learn how to spot gradual measurement drift caused by instrument aging, fixture wear, or environmental changes using TofuPilot's trend and control charts.

Learn how to build full observability into your hardware test operations using TofuPilot's dashboards, alerts, and analytics.

Learn how to break down test performance by step to find which phases fail most, run slowest, or have the lowest Cpk using TofuPilot's step analysis.

Learn how to build dashboards and visualizations for hardware test data using TofuPilot's built-in analytics and charting tools.

Understand COPQ categories, the 1-10-100 rule for defect costs, and how proper test coverage with TofuPilot catches issues before they become expensive.

Learn how to export test data from TofuPilot to Power BI using CSV exports and the REST API for custom management reports and cross-system analysis.

Learn how to detect anomalies in hardware test measurements using TofuPilot's analytics and automated limit checking.

Actionable strategies to improve first pass yield (FPY) in electronics manufacturing, with root cause analysis, Pareto charts, limit refinement, and TofuPilot.

Learn how to use control charts to monitor test process stability, distinguish control limits from spec limits, and detect out-of-control conditions with.

Learn how to structure, store, and query electronics test data with TofuPilot for automatic traceability, yield tracking, and process control.